Test signal generation for analog circuits

Advances in Radio Science Test signal generation for analog circuits

In this paper a new test signal generation approach for general analog circuits based on the variational calculus and modern control theory methods is presented. The computed transient test signals also called test stimuli are optimal with respect to the detection of a given fault set by means of a predefined merit functional representing a fault detection criterion. The test signal generation ...

Automatic Test Generation for Maximal Diagnosis of Linear Analog Circuits

A fault-based multifrequency test generation and fault diagnosis procedure is proposed in this work. The procedure selects a minimal set of test measures and generates the minimal set of frequency tests which guarantee maximum fault coverage and maximal diagnosis of circuit AC hard/soft faults. The procedure is exempli ed for several self-testable linear analog circuits.

Automatic Test Generation for Linear Analog Circuits under Parameter Variations

|This paper presents a simulation-based approach to automatic test-frequency generation of linear analog circuits considering parameter variations. It consists of two steps. First, a candidate set of frequencies|each detects robustly some faults|is generated by a concurrent and lazy fault simulationmethod. Next, the minimum number of test frequencies to detect all the possible faults is selecte...

Test generation for specification test of analog circuits using efficient test response observation methods

In this paper, a new automated test generation approach for specification testing of analog circuits using test point selection and efficient analog test response waveform capture methods for enhancing the test accuracy is proposed. The proposed approach co-optimizes the construction of a multi-tone sinusoidal test stimulus and the selection of the best set of test response observation points. ...

A Test Method for Analog Circuits